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|Title:||Combination of static time of flight secondary ion mass spectrometry andinfrared reflection–adsorption spectroscopy for the characterisation of a foursteps built-up carbohydrate array||Authors:||Leone, Gemma
|Keywords:||SAMs; Click-chemistry; ToF-SIMS; RAIRS||Issue Date:||2012||Project:||None||Journal:||APPLIED SURFACE SCIENCE||Abstract:||
Carbohydrate microarrays are essential tools to determine functions of glycans. In this work we analysed the applicability of a four-step procedure, previously used to monolayers [G. Leone, M. Consumi, A. Tognazzi, A. Magnani, Realisation and chemical characterisation of a model system for saccharide-based biosensor, Thin Solid Films 519 (2010) 462–470], for the realisation of micropatterned substrates. The applicability was demonstrated by a combination of static time of flight secondary ion mass spectrometry and infrared reflection–adsorption spectroscopy (ToF-SIMS) which permitted not only to confirm the functionalisation of the substrates but also to detect the orientation of bound molecules. The ToF-SIMS raw data were also analysed by principal component analysis and cluster analysis to minimise the bias and confirm the validity of the results. The discriminating action of the modified supports versus cell adhesion was also demonstrated.
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