Please use this identifier to cite or link to this item: http://hdl.handle.net/20.500.12779/4753
Title: Ultrathin nickel oxide films grown on Ag(0 0 1): a studyby XPS,LEIS and LEED intensity analysis
Authors: M., Caffio
B., Cortigiani
G., Rovida
Atrei, Andrea Massimo 
C., Giovanardi
A., DI BONA
S., Valeri
Issue Date: 2003
Project: None 
Journal: SURFACE SCIENCE
Description: 
41117
URI: http://hdl.handle.net/20.500.12779/4753
ISSN: 0039-6028
DOI: 10.1016/S0039-6028(03)00544-2
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